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Updated: Jun 5, 2025

Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
Ji Xia1, Qifeng Qiao1, Haoyang Sun1
1Department of Mechanical Engineering, National University of Singapore, 9 Engineering Drive 1, Singapore, 117575, Singapore.
This study introduces an optomechanical electrometer for highly sensitive electric charge detection. The device utilizes a nanophotonic system to achieve unprecedented precision in sensing charged nanoparticles for various applications.
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