Updated: Jun 5, 2025

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Sam Lin1, Yixin Chen1,2, Zi Jing Wong1,2
1Department of Materials Science and Engineering, Texas A&M University, College Station, TX 77843, USA.
Advanced nanophotonic platforms offer chip-scale optical beam steering for technologies like LiDAR and VR/AR. These methods promise faster, smaller, and more reliable devices compared to traditional bulky systems.
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