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Updated: Jun 5, 2025

Failure Analysis of Batteries Using Synchrotron-based Hard X-ray Microtomography
Published on: August 26, 2015
Origin of fast charging in solid-state batteries revealed by Cryo-transmission X-ray microscopy
Jiaxuan Liu1,2,3, Yajie Song1,2,4, Qingsong Liu1,2,3,4
1School of Chemistry and Chemical Engineering, Harbin Institute of Technology, Harbin 150001, China.
Abstract:
The interface issue poses a limitation on the fast charging of solid-state batteries (SSBs), with the high-impedance non-Faraday electric field serving as a pivotal factor. However, the mechanism of fast-charging capability degradation triggered by the dynamic evolution of non-Faraday electric fields remains unclear due to the lack of particle-scale nondestructive detection techniques. Here, we dissect the generation and elimination processes of non-Faradaic electric field in segments using the developed operando cryogenic transmission X-ray microscopy (Cryo-TXM). This method accurately tracks the ion self-balancing pathways in LiNi0.8Co0.1Mn0.1O2 (NCM811) post-fast-charging, elucidating the high polarization during late charging caused by exacerbated irreversible local electric field. By intermittently applying reverse potential during fast charging to alleviate the exacerbation of non-Faradaic electric field at the cathode interface, we achieved a roughly 400% reversible capacity increase of SSBs at 10 C. This insightful dynamic imaging method effectively captures and resolves the transient, opaque signals within SSBs, significantly enhancing their fast-charging performance.
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