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Updated: Jun 5, 2025

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Layer-dependent Schottky contact at TaX2-BY (X = S, Se, Te; Y = P, As, Sb) van der Waals interfaces
Israr Ul Haq1, A Mustaqeem1, B Ali1
1Department of Physics, Abbottabad University of Science & Technology Abbottabad 22010 Pakistan binukhn@gmail.com +92-333-943-665.
Abstract:
The mechanical, thermal and dynamical stabilities, electronic structure, contact type, and height of the barrier at the interface of TaX2 (X = S, Se, Te) and BY (Y = P, As, Sb) metal-semiconductor (MS) contact are investigated via first principles calculations. Binding energies, mechanical properties, phonon spectra and ab initio molecular dynamics (AIMD) simulations confirm the stabilities of these systems. TaX2-BY (X = S, Se, Te; Y = P, As, Sb) MS van der Waals heterostructures (vdWHs) are found to be metal with a Schottky contact at the interface. Formation of the n-type Schottky contact at the interface of TaX2-BY (X = S, Se, Te; Y = P, As, Sb) MS vdWHs favors electron conduction over hole conduction. Small (higher) effective mass (carrier mobility) make TaS2-BSb, TaSe2-BSb and TaTe2-BSb MS vdWHs, potential candidates for high speed nanoelectronic applications. Bader charge analysis shows that at the interface of TaX2-BY (X = S, Se, Te; Y = P, As, Sb) MS vdWHs, in TaX2 (BP, BAs) the electrons transfer from the TaX2 layer to the BP and BAs layer, while in TaX2 (BSb) the electrons transfer from the BSb layer to TaX2 layer.
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