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Integrated optical probing scheme enabled by localized-interference metasurface for chip-scale atomic magnetometer.

Jinsheng Hu1,2, Zihua Liang1,2, Peng Zhou1,2

  • 1Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Ministry of Education, School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing 100191, China.

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Summary

Researchers developed a chip-scale optical probing scheme using metasurfaces for miniaturized atomic sensors. This integrated approach enables compact optically pumped magnetometers (OPMs) for high-resolution biomagnetism imaging.

Keywords:
atomic magnetometerchip-scale quantum sensorsintegrated optical probingmeta-polarizermulti-functional metasurface

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Area of Science:

  • Atomic physics and sensor technology
  • Nanophotonics and metamaterials
  • Biomedical instrumentation

Background:

  • Optically pumped magnetometers (OPMs) are crucial for high-spatial-resolution biomagnetism imaging.
  • Conventional OPMs rely on bulky optical components, hindering miniaturization and chip-scale integration.
  • Existing optical probing systems face challenges in polarization conversion and wavefront shaping for compact devices.

Purpose of the Study:

  • To develop an integrated optical probing scheme for chip-scale OPMs.
  • To design and fabricate metasurfaces for tailorable polarization conversion and wavefront manipulation.
  • To demonstrate a compact, chip-integrated OPM for biomagnetism applications.

Main Methods:

  • Development of localized-interference metasurfaces for optical probing.
  • Fabrication and characterization of silicon-based meta-polarizer and meta-polarizer-lens.
  • Integration of a miniaturized vapor cell with a meta-polarizer to construct a compact OPM.

Main Results:

  • Meta-polarizer achieved 86.29% transmission efficiency and 14.2 dB extinction ratio.
  • Meta-polarizer-lens demonstrated 72.79% focusing efficiency and 6.4 dB extinction ratio.
  • The compact OPM achieved a sensitivity of ~9 fT/Hz^1/2 and a dynamic range of ±2.3 nT.

Conclusions:

  • The developed metasurface-based optical probing scheme is a promising solution for chip-scale integration.
  • This technology facilitates the development of miniaturized OPMs for advanced atomic devices.
  • The study paves the way for chip-integrated atomic sensors with enhanced functionality.