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Updated: Jun 30, 2026

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
Published on: July 17, 2015
Kang Ryeol Lee1, JinGyu Youn1, SeokJae Yoo1
1Inha University, Incheon, Republic of Korea.
Deterministic reflection contrast ellipsometry (DRCE) accurately measures optical permittivity in 2D heterostructures. This new method overcomes interference challenges, enabling precise characterization of 2D materials.
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