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This study introduces a novel method to detect and quantify data bias in artificial intelligence (AI) models, improving predictions for materials discovery by excluding unreliable out-of-the-box samples.

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Area of Science:

  • Materials Science
  • Data Science
  • Artificial Intelligence

Background:

  • Accurate artificial intelligence (AI)-driven models rely heavily on data quantity and quality.
  • Bias in sample selection during database generation can lead to unreliable predictions when AI models are applied to data with different origins.
  • This bias can hinder AI-based materials discovery, even with large, high-quality datasets.

Purpose of the Study:

  • To develop a method for detecting and quantifying data bias in AI models.
  • To reduce the impact of data bias on materials discovery.
  • To enhance the reliability of AI models for diverse and unseen materials.

Main Methods:

  • A classification strategy is employed to identify and quantify data bias.
  • The method identifies 'out-of-the-box' materials where pretrained model predictions are likely unreliable.
  • The approach is validated using superconductor and thermoelectric materials.

Main Results:

  • The proposed method effectively detects and quantifies data bias.
  • It successfully identifies materials outside the training data distribution for which predictions are unreliable.
  • The methodology enhances the reliability of AI models for materials discovery.

Conclusions:

  • The developed method offers a simple, flexible, and adaptable solution for bias detection in AI.
  • It improves the trustworthiness of AI models applied to new materials, advancing AI-driven materials discovery.
  • This approach is compatible with various AI architectures, including graph equivariant neural networks.