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Updated: Jun 4, 2025

A Novel Method for In Situ Electromechanical Characterization of Nanoscale Specimens
Published on: June 2, 2017
Qiushi Li1, Antonia Antoniou1, Olivier N Pierron1
1G.W. Woodruff School of Mechanical Engineering, Georgia Institute of Technology, Atlanta, Georgia 30318, United States.
Understanding conductive ink degradation is vital for flexible electronics. This study reveals that crack widening and shearing within existing cracks, not delamination, drive resistance increases during cyclic loading.
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