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Imaging Corrosion at the Metal-Paint Interface Using Time-of-Flight Secondary Ion Mass Spectrometry
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Application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) in forensic science - A review

Elżbieta Maćkiewicz1, Jacek Rogowski1, Małgorzata Iwona Szynkowska-Jóźwik1

  • 1Institute of General and Ecological Chemistry, Faculty of Chemistry, Lodz University of Technology, Zeromskiego 116, Lodz 90-924, Poland.

Forensic Science International
|December 21, 2024
PubMed

Keywords:
FingermarksFingerprint analysisFingerprintsForensic scienceInk analysisQuestioned documentToF-SIMS

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