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Point-spread-function engineering in MINFLUX: optimality of donut and half-moon excitation patterns
Optics Letters
|December 24, 2024
Summary
Researchers optimized excitation patterns for Maximally INFormative LUminescence eXcitation (MINFLUX) super-resolution microscopy. New half-moon beams nearly double localization precision, surpassing conventional donut beams.
Area of Science:
- Optics and Photonics
- Biophysics
- Microscopy
Background:
- Localization microscopy breaks the optical diffraction limit for super-resolution imaging.
- Maximally INFormative LUminescence eXcitation (MINFLUX) enhances resolution by optimizing excitation point spread function (PSF) and minimizing photon flux.
- The optimality of various proposed MINFLUX beam shapes for localization efficiency is not well-established.
Purpose of the Study:
- To determine optimal excitation patterns for MINFLUX super-resolution microscopy using a numerical and theoretical framework.
- To computationally search for novel beam patterns, reducing the need for costly experimental exploration.
- To evaluate the performance of new beam patterns against conventional methods.
Main Methods:
- Development of a numerical and theoretical framework for analyzing MINFLUX excitation patterns.
- Computational search for optimal beam shapes to maximize localization precision.
- Comparison of theoretical localization precision for different beam patterns, including donut and novel half-moon shapes.
Main Results:
- The conventional donut beam is identified as a robust optimum when all excitation beams share the same shape.
- A novel PSF engineering framework identified two pairs of orthogonal half-moon beams.
- These new half-moon beams theoretically improve localization precision by approximately a factor of two.
Conclusions:
- The study provides a computational approach for discovering optimal MINFLUX excitation patterns.
- Novel half-moon beams offer a significant advancement in MINFLUX super-resolution imaging, nearly doubling localization precision.
- This work paves the way for more efficient and precise super-resolution microscopy techniques.

