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A novel Alzheimer detection rapid-testing low-cost technique by a gate engineered gate stack dual-gate FET device
Anirban Kolay1, Amitesh Kumar2
1Nextgen Adaptive Systems Group, Department of Electrical Engineering, National Institute of Technology Patna, Bihar, India; Department of Electrical Engineering, Heritage Institute of Technology, Kolkata, West Bengal, India.
Talanta
|December 25, 2024
Summary
This study presents a low-cost Gate-Stack Field Effect Transistor (FET) method for Alzheimer's disease (AD) detection. The device differentiates AD-affected grey matter by analyzing changes in dielectric properties and drain current.
Area of Science:
- Biomedical Engineering
- Materials Science
- Neuroscience
Background:
- Alzheimer's disease (AD) diagnosis currently relies on complex and costly methods.
- Early detection of AD is crucial for effective patient management and treatment.
- Developing rapid, low-cost diagnostic tools is a significant unmet need.
Purpose of the Study:
- To develop and validate a novel, quick, and affordable method for detecting Alzheimer's disease (AD).
- To evaluate the efficacy of Gate-Stack (GS) Field Effect Transistors (FETs) for differentiating between healthy and AD-affected grey matter samples.
- To establish a point-of-care (POC) diagnostic approach for AD.
Main Methods:
- Utilized Single-Metal (SM), Dual-Metal (DM), and Tri-Metal Double Gate (DG) FET configurations with etched nanocavities for sample immobilization.
- Employed Solid-phase microextraction (SPME) to collect grey matter samples.
- Analyzed changes in device drain current and performance at 2.4 GHz, correlating them with the dielectric constant alterations caused by sample immobilization.
Main Results:
- Demonstrated that AD-affected and healthy grey matter exhibit distinct dielectric characteristics at high frequencies.
- Observed significant alterations in device drain current and ION/IOFF ratios correlating with the dielectric changes.
- Successfully differentiated between AD and healthy samples using the proposed FET-based detection technique.
Conclusions:
- The developed GS-FET method offers a promising, rapid, and low-cost approach for Alzheimer's disease detection.
- The technique's sensitivity to dielectric property changes in grey matter enables accurate sample differentiation.
- The proposed method holds potential for point-of-care (POC) diagnosis of Alzheimer's disease.
