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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

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Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
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Concurrent Quantitative Conductivity and Mechanical Properties Measurements of Organic Photovoltaic Materials using AFM
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Probing Out-Of-Plane Charge Transport in Organic Semiconductors Using Conductive Atomic Force Microscopy.

Mindaugas Gicevičius1, Haoxin Gong1, Nicholas Turetta2

  • 1Cavendish Laboratory, University of Cambridge, JJ Thomson Avenue, Cambridge, CB3 0HE, UK.

Advanced Materials (Deerfield Beach, Fla.)
|December 26, 2024
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Summary
This summary is machine-generated.

High contact resistance in organic semiconductors (OSCs) is a major hurdle. This study addresses out-of-plane conductivity, revealing a linear increase in resistance with molecular layers and introducing a new method to measure it.

Keywords:
conductive atomic force microscopycontact resistancehigh mobilityorganic semiconductors

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Area of Science:

  • Materials Science
  • Condensed Matter Physics
  • Organic Electronics

Background:

  • High contact resistance impedes organic semiconductor (OSC) performance in electronic circuits.
  • Existing research focuses on interface resistance, neglecting bulk resistance contributions like out-of-plane conductivity.
  • Minimizing OSC film thickness is the primary method to reduce bulk resistance.

Purpose of the Study:

  • To investigate the out-of-plane charge transport in multi-layered, solution-processed organic semiconductor films.
  • To develop a method for quantifying out-of-plane resistivity in organic semiconductors.
  • To understand charge transport at the molecular level in organic thin films.

Main Methods:

  • Utilized conductive-probe atomic force microscopy (C-AFM) to measure out-of-plane charge transport.
  • Investigated multi-layered films of 2,9-dioctylnaphtho[2,3-b]naphtha[2',3':4,5]thieno[2,3-d]thiophene (C8-DNTT-C8).
  • Developed and applied a vertical transfer length method (V-TLM) for resistivity measurements.

Main Results:

  • Demonstrated a linear relationship between out-of-plane resistance and the number of molecular layers.
  • Modeled the observed resistance using an equivalent circuit with series-connected tunneling barriers.
  • Successfully determined the out-of-plane resistivity of the organic semiconductor films.

Conclusions:

  • Out-of-plane conductivity is a significant factor in the bulk resistance of organic semiconductors.
  • The V-TLM method, enabled by C-AFM, provides insights into molecular-scale charge transport.
  • This approach can accelerate the discovery and development of high-performance organic electronic materials.