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Random Illumination Microscopy: faster, thicker, and aberration-insensitive
1Department of Biomedical Engineering, College of Future Technology, Peking University, Beijing, 100871, China.
Abstract:
The Extended Depth of Field (EDF) approach has been combined with Random Illumination Microscopy (RIM) to realize aberration-insensitive, fast super-resolution imaging with extended depth, which is a promising tool for dynamic imaging in larger and thicker live cells and tissues.
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