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Updated: Jun 4, 2025

Visualizing Membrane Ruffle Formation using Scanning Electron Microscopy
Published on: May 27, 2021
Hiroki Ida1,2,3,4,5, Noriko Taira5, Yuji Nashimoto2,6
1Department of Electrical Engineering, Graduate School of Engineering, Nagoya University, Nagoya, Aichi 464-8601, Japan.
Scanning ion conductance microscopy (SICM) revealed that epithelial-mesenchymal transition (EMT) reduces cell surface ruffles. SICM surface measurements can track EMT progression by monitoring these nanoscale membrane changes.
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