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Published on: August 7, 2018
Void Evolution at the Li/LLZO Interface: Stack Pressure and Operating Temperature-Driven Creep Effect.
Ke Li1, Jundi Huang1, Xinyi Qu1
1School of Energy and Power Engineering, Huazhong University of Science & Technology, Wuhan, Hubei 430074, China.
Stack pressure and temperature enhance solid-state battery stability by promoting lithium metal creep, which heals interface voids. This research provides a model to optimize conditions for void healing and improved battery performance.
Area of Science:
- Materials Science
- Electrochemistry
- Solid-state Batteries
Background:
- All-solid-state lithium metal batteries offer high energy density and safety but suffer from interface voids during cycling.
- Void formation at the lithium metal anode/solid-state electrolyte interface degrades contact and cycle stability.
- Understanding the role of stack pressure and temperature on void evolution via creep is crucial for interface stability.
Purpose of the Study:
- To develop a model for void evolution at the lithium metal anode/solid-state electrolyte interface.
- To investigate the influence of stack pressure and operating temperature on void healing through creep deformation.
- To establish a theoretical basis for optimizing pressure and temperature to ensure interface stability.
Main Methods:
- Developed a coupled electrochemical-diffusion-mechanical (creep)-phase field for void evolution (EDMP-VE) model.
- Modeled lithium stripping/deposition, diffusion, creep, lattice distortion, and vacancy dynamics.
- Utilized normalized geometric parameters and stress/strain evolution to characterize void dynamics.
Main Results:
- The EDMP-VE model accurately captures void evolution during lithium stripping and plating cycles.
- High stack pressure and operating temperature promote lithium metal creep, suppressing void expansion and accelerating void filling.
- A phase diagram identified optimal pressure-temperature windows for void healing and interface stability.
Conclusions:
- Stack pressure and operating temperature-driven creep significantly impact void evolution and interface integrity in solid-state batteries.
- Optimizing these parameters can lead to void annihilation and improved interfacial contact.
- This study provides a theoretical framework and practical guidance for enhancing solid-state battery cycle life.
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