A New Methodology for Selecting CT Scanning Parameters Depending on the Density of Materials

Area of Science:

• Industrial Metrology
• Materials Science
• Non-Destructive Testing

Background:

• Computed tomography (CT) scanners are versatile tools used in both medical and industrial applications, including defect detection and dimensional measurements.
• Selecting optimal CT parameters, particularly voltage, is complex due to the wide range of material densities and properties.
• Current parameter selection processes can be time-consuming, often consuming significant portions of the total measurement duration.

Purpose of the Study:

• To develop a systematic approach for selecting computed tomography (CT) scanning parameters based on material properties.
• To optimize the selection of CT voltage parameters to enhance measurement accuracy and efficiency.
• To reduce the time required for CT parameter selection in industrial non-destructive testing applications.

Main Methods:

• Determined a curve correlating maximum and minimum CT lamp voltage with material density.
• Employed a third-degree polynomial interpolation and cubic spline functions to calculate intermediate voltage values for various material densities.
• Developed a multi-criteria matrix for CT parameter selection, validated through experiments at an Accredited Coordinate Metrology Laboratory.

Main Results:

• Successfully established a method for determining optimal CT voltage ranges based on material density.
• The developed interpolation polynomial and cubic spline approach accurately predicted intermediate voltage values.
• Experimental validation demonstrated a significant reduction in CT parameter selection time, averaging 30 minutes, and improved measurement accuracy.

Conclusions:

• The proposed method effectively optimizes CT scanning parameter selection by utilizing material density and advanced interpolation techniques.
• This approach significantly reduces the time and complexity associated with setting up CT scans for non-destructive testing.
• The findings facilitate more efficient and accurate industrial CT metrology, enhancing quality control processes.