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Updated: Jun 1, 2026

Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes
Published on: May 23, 2017
Feifan Xu1,2,3, Yinye Ding2, Wenhao Chen3
1Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, Hefei University of Technology, Hefei 230009, China.
This study introduces an advanced Moiré fringe phase extraction algorithm for nanoimprint lithography wafer-mask alignment. The new method enhances alignment accuracy to the nanometer level, outperforming existing techniques.
09:45Large-area Scanning Probe Nanolithography Facilitated by Automated Alignment and Its Application to Substrate Fabrication for Cell Culture Studies
Published on: June 12, 2018
06:21Design and Development of a Three-Dimensionally Printed Microscope Mask Alignment Adapter for the Fabrication of Multilayer Microfluidic Devices
Published on: January 25, 2021
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