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Updated: Jun 3, 2025

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A Standard and Reliable Method to Fabricate Two-Dimensional Nanoelectronics
Published on: August 28, 2018
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Editorial for the Special Issue on the Latest Advancements in Semiconductor Materials, Devices and Systems
Xinghuan Chen1, Fangzhou Wang2, Zirui Wang3
1The China Electronic Product Reliability and Environmental Testing Research Institute, Guangzhou 510610, China.
Micromachines
|January 8, 2025
Abstract:
The field of semiconductor research is experiencing a paradigm shift as the boundaries of Moore's Law are being approached [...].
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