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Balancing Page Endurance Variation Between Layers to Extend 3D NAND Flash Memory Lifetime
Jialin Wang1, Yi Fan2, Yajuan Du2
1College of Electrical Engineering, Naval University of Engineering, Wuhan 430033, China.
Micromachines
|January 8, 2025
Summary
Endurance variations in 3D NAND flash memory layers significantly impact device lifetime. A new layer-aware write strategy (LA-Write) mitigates this by intelligently skipping writes on weaker bottom layers, extending SSD lifespan.
Area of Science:
- Solid State Physics
- Materials Science
- Computer Engineering
Background:
- 3D NAND flash memory utilizes vertical stacking for increased capacity.
- Process variations lead to significant endurance differences between stacked layers.
- Layer endurance variation underutilizes pages and reduces overall flash memory lifetime.
Purpose of the Study:
- Investigate endurance variation characteristics across different layers in 3D NAND flash memory.
- Identify the primary layer responsible for lifetime limitations.
- Propose and evaluate a novel write strategy to address endurance variations.
Main Methods:
- Categorized stacked layers into top, middle, and bottom based on endurance.
- Developed a layer-aware write strategy (LA-Write) incorporating a write-skip unit.
- Implemented a layer-aware table to manage write-skip probabilities per layer.
- Simulated LA-Write performance using DiskSim, a popular SSD simulator.
Main Results:
- Bottom layer pages exhibit significantly weaker endurance compared to top and middle layers.
- LA-Write prioritizes write-skip operations on weaker bottom layers.
- Experimental results demonstrate a substantial increase in SSD lifetime with LA-Write.
Conclusions:
- The endurance variation between layers, particularly the weak endurance of bottom layers, is a critical factor limiting 3D NAND flash memory lifetime.
- The proposed LA-Write strategy effectively mitigates endurance variations by intelligently managing write operations.
- LA-Write offers a promising solution for enhancing the longevity and reliability of 3D NAND-based SSDs.

