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Three-Dimensional Surface Reconstruction for Specular/Diffuse Composite Surfaces
Chung-Hsuan Huang1, Ssu-Chia He1, Tsung-Yu Chen2
1Institute of Electro-Optical Engineering, National Taiwan Normal University, Taipei 11677, Taiwan.
Sensors (Basel, Switzerland)
|January 8, 2025
Summary
This study introduces a novel 3D surface reconstruction method for composite surfaces. It effectively profiles materials with both specular and diffuse reflectance using integrated digital holography and fringe projection.
Area of Science:
- Optics and Photonics
- Metrology
- Materials Science
Background:
- Fringe projection techniques excel on diffuse surfaces but struggle with specular components.
- Measuring composite surfaces with mixed reflectance is challenging for traditional 3D profilometry.
- Accurate 3D surface profiling is crucial for quality control in electronics manufacturing.
Purpose of the Study:
- To develop an effective 3D surface reconstruction technique for composite surfaces.
- To overcome the limitations of fringe projection on surfaces with mixed specular and diffuse reflectance.
- To enable simultaneous capture of both reflected light types in a single optical path.
Main Methods:
- Integration of digital holography with fringe projection setup.
- Simultaneous capture of specular and diffuse reflected light.
- Full-field surface profilometry using combined optical paths.
- Absolute phase determination of composite surfaces via fringe analysis.
Main Results:
- Successful and accurate 3D profile reconstruction of composite surfaces.
- Effective detection of both specular and diffuse reflectance components.
- Demonstrated capability for precise 3D surface measurement of integrated circuit carrier boards.
- Validation of the technique's effectiveness on complex, real-world samples.
Conclusions:
- The proposed technique offers a robust solution for 3D surface reconstruction of challenging composite materials.
- Combining digital holography and fringe projection enhances measurement accuracy and efficiency.
- This method advances non-destructive testing and quality assessment for electronic components.
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