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Electrical Characteristics of Solution-Based Thin-Film Transistors with a Zinc-Tin Oxide/Carbon Nanotube Stacked
Yong-Jae Kim1, Woon-Seop Choi1
1Department of Semiconductor Engineering, Hoseo University, Asan 31499, Republic of Korea.
Abstract:
A stacked nanocomposite zinc-tin oxide/single-walled carbon nanotubes (ZTO/SWNTs) active layer was fabricated for thin-film transistors (TFTs) as an alternative to the conventional single-layer structure of mixed ZTO and SWNTs. The stacked nanocomposite of the solution-processed TFTs was prepared using UV/O3 treatment and multiple annealing steps for each layer. The electrical properties of the stacked device were superior to those of the single-layer TFT. The ZTO/SWNT TFT, fabricated using a stacked structure with ZTO on the top and SWNT at the bottom layer, showed a significant improvement in the field-effect mobility of 15.37 cm2/V·s (factor of three increase) and an Ion/Ioff current ratio of 8.83 × 108 with improved hysteresis. This outcome was attributed to the surface treatment and multiple annealing of the selected active layer, resulting in improved contact and a dense structure. This was also attributed to the controlled dispersion of SWNT, as electron migration paths without dispersants. This study suggests the potential expansion of applications, such as flexible electronics and low-cost fabrication of TFTs.
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