Leveraging Segment Anything Model (SAM) for Weld Defect Detection in Industrial Ultrasonic B-Scan Images

Amir-M Naddaf-Sh1, Vinay S Baburao2, Hassan Zargarzadeh1

  • 1Phillip M. Drayer Electrical Engineering Department, Lamar University, Beaumont, TX 77705, USA.

PubMed