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Cryo-electron Microscopy Specimen Preparation By Means Of a Focused Ion Beam
Published on: July 26, 2014
Heat Transfer Analysis of Cryogenic EXLO Specimen Handling
Kyle W Beggs1, Thomas E Dougherty2, Alain J Kassab1
1Centecorp LLC, Longwood, 147 Parsons Rd, FL 32779, USA.
Abstract:
A conduction heat transfer analysis of ex situ lift-out specimen handling under cryogenic conditions (cryo-EXLO) is performed and compared with experimentally determined temperature values using a type K thermocouple. Using a finite-volume solver for heat conduction, the analysis confirms that manipulation of a specimen by a probe above a working surface cooled at liquid nitrogen (LN2) temperatures can remain below the critical vitreous temperature up to several hundreds of micrometers above the working surface, allowing for ample distance for lift out and specimen manipulation. In addition, the temperature above the cryogenic shuttle sample holder working surface remains below the vitreous temperature for several tens of minutes without adding cryogen, yielding sufficient time to complete multiple manipulations. Periodically topping off the cryogen level may allow for unlimited cryo-EXLO manipulations with this hardware and geometry.
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