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Updated: Jun 23, 2026

Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
Published on: January 26, 2016
Miharu Koh1, Jay P Kitt1, Andrew D Pendergast1
1Department of Chemistry, University of Utah, Salt Lake City, Utah, USA.
Investigating thin polymer films reveals distinct crystalline and amorphous phases during melting and crystallization. This study highlights Raman microscopy and SMCR analysis for understanding these crucial structural changes in poly(ethylene oxide) (PEO) films.
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