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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Wei Li1,2,3,4, Zhiyuan Xu1,2,3,4, Yu Yan1,2,3,4
1Institute of Photoelectronic Thin Film Devices and Technology of Nankai University, Tianjin, 300350, China.
This review explores Ti-based MXenes, like Ti3C2Tx, for silicon optoelectronics. These 2D materials offer enhanced conductivity and processability, boosting solar cell and photodetector performance.
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