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Updated: May 31, 2025

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Vector Atomic Magnetometer with Free Induction Decay Detection Based on a Microfabricated Vapor Cell
Pengbo Jiang1, Qi Li2, Jianan Qin1
1Center for Advanced Measurement Science, National Institute of Metrology, Beijing 100029, China.
Micromachines
|January 25, 2025
Summary
This study presents a miniaturized vector atomic magnetometer for precise magnetic field measurement. The device achieves high sensitivity and low angular error, offering a new approach for vector magnetic field detection.
Area of Science:
- Physics
- Quantum Sensing
- Instrumentation
Background:
- Atomic magnetometers are crucial for weak magnetic field detection.
- Current trends focus on extracting vector information with high-precision scalar detection.
- Miniaturization is a key development goal for atomic magnetometers.
Purpose of the Study:
- To introduce a novel vector atomic magnetometer with a microfabricated vapor cell.
- To demonstrate high-precision in-plane vector magnetic field measurements.
- To provide a new method for vector magnetic field measurement in miniaturized devices.
Main Methods:
- Utilizing a 5 mm-thick microfabricated vapor cell.
- Operating the magnetometer in free-induction-decay mode.
- Employing orthogonal modulation techniques for vector measurements.
Main Results:
- Achieved high-precision in-plane vector magnetic field measurements in the x-z plane.
- Demonstrated a total field sensitivity of 30 pT·Hz-1/2 @11 µT.
- Obtained an average angular error of 4.7 mrad @7.6 µT for decoupled vector magnetic field measurements.
Conclusions:
- The developed vector atomic magnetometer offers a new approach for miniaturized magnetic field sensing.
- The device successfully combines high-precision scalar detection with vector information extraction.
- The results highlight the potential for advanced applications requiring sensitive vector magnetic field measurements.
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