A High-Temperature and Wide-Permittivity Range Measurement System Based on Ridge Waveguide.

Area of Science:

• Materials Science
• Electromagnetics
• Chemical Engineering

Background:

• Microwave energy offers diverse applications, particularly in clean energy technologies.
• Expanding microwave heating in metallurgy requires precise permittivity data of ores during heating.
• Accurate dielectric property measurement at high temperatures is a significant challenge.

Purpose of the Study:

• To design and validate a ridge waveguide apparatus for measuring complex relative permittivity.
• To enable high-temperature dielectric property measurements up to 1100 °C.
• To support the advancement of microwave-assisted metallurgy.

Main Methods:

• A 2.45 GHz ridge waveguide system was designed based on the transmission/reflection method.
• The apparatus was developed to measure complex relative permittivity across a wide temperature range.
• The system facilitates rapid measurements during material heating processes.

Main Results:

• The developed system accurately measures complex relative permittivity from room temperature to 1100 °C.
• Experimental results demonstrate the capability for rapid measurements during heating.
• The system accurately captures dielectric properties even with wide variations in permittivity and loss tangent.

Conclusions:

• The novel measurement system is suitable for high-temperature dielectric property analysis.
• This technology has significant potential for applications in microwave-assisted metallurgy.
• Accurate permittivity measurements are key to optimizing microwave heating processes in materials science.