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Updated: May 30, 2025

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
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Capacitance enhancement by ion-laminated borophene-like layered materials

Tetsuya Kambe1,2,3,4,5, Masahiro Katakura6, Hinayo Taya6

  • 1Center for Future Innovation (CFi), Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka, 565-0871, Japan. kambe.t.aa@chem.eng.osaka-u.ac.jp.

Nature Communications
|January 27, 2025
PubMed

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