Scanning Electron Microscopy
Confocal Fluorescence Microscopy
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: May 30, 2025

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
Published on: May 10, 2021
Trevor Reutershan1,2, Christine V Nguyen1, Haytham H Effarah1,2
1Department of Physics and Astronomy, University of California - Irvine, Irvine, California, USA.
Scanning K-edge subtraction (SKES) enables rapid K-edge subtraction imaging using laser-Compton x-ray sources. This new technique improves tumor detection in dense breast tissue with significantly less radiation dose.
07:55Elemental-sensitive Detection of the Chemistry in Batteries through Soft X-ray Absorption Spectroscopy and Resonant Inelastic X-ray Scattering
Published on: April 17, 2018
10:42In Depth Analyses of LEDs by a Combination of X-ray Computed Tomography CT and Light Microscopy LM Correlated with Scanning Electron Microscopy SEM
Published on: June 16, 2016
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: