The Nano Exposure Quantifier: a quantitative model for assessing nanoparticle exposure in the workplace

Exposure to manufactured nanomaterials (MNs) is a growing concern for occupational health and safety. Reliable methods for assessing and predicting MN exposure are essential to mitigate associated risks. This study presents the development of the Nano Exposure Quantifier (NEQ), a mechanistic model designed to assess airborne MN exposure in the workplace. By utilizing a dataset of 128 MN measurements from existing exposure studies, the model demonstrates its effectiveness in estimating MN exposure levels for particles smaller than 10 µm. The NEQ provides estimates in terms of particle number concentration accompanied by a 95% confidence interval (CI), enabling a comprehensive assessment of MN exposure. The NEQ includes 2 quantitative models: a simplified tier 1 model and a more comprehensive tier 2 model. Both tier 1 and tier 2 models exhibit robust performance, with correlation coefficients (r) of 0.57 and 0.62, respectively. The models exhibit a moderate level of error, as indicated by residuals' standard deviation of 4.10 for tier 1 and 3.90 for tier 2. The tier 1 model demonstrates a slightly higher overestimation bias (1.15) compared to the tier 2 model (0.54). Overall, the NEQ offers a practical and reliable approach for estimating MN exposure in occupational settings. Future validation studies will investigate the impact of initial calibration efforts, heteroscedasticity, and further refine the model's accuracy.