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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Atomic force microscopy lateral force calibration using a V-shape scratch made by a nanoindenter.

Pierre-Emmanuel Mazeran¹, Sebastian Jaramillo-Isaza², Risa-Nurin Baiti²

¹Université de Technologie de Compiègne, Roberval (Mécanique, énergie et électricité), Centre de Recherche Royallieu-CS 60 319, 60203 Compiègne Cedex, France.

The Review of Scientific Instruments

|February 4, 2025

Summary

This summary is machine-generated.

This study introduces a novel, cost-effective method for calibrating atomic force microscopy (AFM) lateral force measurements. A simple V-shaped scratch on fused silica provides a reliable standard for accurate nanoscale friction force determination.

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Area of Science:

Materials Science
Nanotechnology
Surface Science

Background:

Accurate nanoscale friction force measurement using atomic force microscopy (AFM) is challenging.
Existing lateral force calibration methods, like the wedge method, often require specialized calibration samples.
There is a need for simpler, more accessible calibration standards.

Purpose of the Study:

To revisit and improve the wedge method for lateral force calibration in AFM.
To introduce a new, inexpensive, and easy-to-fabricate calibration standard.
To enhance the reliability and accuracy of nanoscale friction measurements.

Main Methods:

Fabrication of a V-shaped scratch on a fused silica substrate using a Berkovich nanoindenter tip.
Characterization of the scratch facets for constant slope and friction coefficient.
Application of the V-shaped scratch as a standard for the wedge method in AFM.

Main Results:

The V-shaped scratch presents two large, opposite facets with identical, moderate, and constant slope and friction coefficient.
This novel standard simplifies data processing for lateral force calibration.
The proposed method leads to more reliable and accurate AFM lateral force calibration.

Conclusions:

A V-shaped scratch on fused silica serves as an effective and economical standard for AFM lateral force calibration.
This approach simplifies the wedge method, improving accuracy and reliability.
The findings offer a practical solution for researchers needing precise nanoscale friction measurements.