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A texture enhanced attention model for defect detection in thermal protection materials
Jialin Song1, Zhaoba Wang2,3, Kailiang Xue1
1School of Information and Communication Engineering, North University of China, Taiyuan, 030051, China.
Scientific Reports
|February 10, 2025
Summary
A new texture-enhanced attention defect detection (TADD) model accurately identifies internal defects in thermal protection materials. This advanced model improves spacecraft safety by overcoming challenges with small, multi-scale defects and low contrast in radiographic images.
Area of Science:
- Materials Science
- Aerospace Engineering
- Computer Vision
Background:
- Internal defects in thermal protection materials are critical for aerospace safety.
- Existing defect detection models face challenges with defect-background similarity, tiny defects, and multi-scale characteristics.
- A lack of real-world defect datasets hinders model development.
Purpose of the Study:
- To develop an accurate and efficient defect detection model for thermal protection materials.
- To address limitations in detecting small, multi-scale, and low-contrast defects.
- To create a comprehensive dataset for training and evaluating defect detection models.
Main Methods:
- Construction of a thermal protection material digital radiographic (DR) image dataset (TPMDR-dataset).
- Proposal of a texture-enhanced attention defect detection (TADD) model.
- Integration of a texture enhancement module, non-local dual attention, and path aggregation network.
Main Results:
- The TADD model achieved higher mean Average Precision (mAP) on the TPMDR-dataset and public datasets.
- The model demonstrated real-time detection capabilities at 25 frames per second.
- Performance exceeded the baseline model by 11.05%.
Conclusions:
- The TADD model offers a significant advancement in detecting internal defects in thermal protection materials.
- The developed dataset and model contribute to improved structural integrity and safety in aerospace applications.
- The TADD model effectively handles challenges posed by defect size, scale, and feature visibility.

