Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

4.1K
A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
4.1K
Atomic Force Microscopy01:08

Atomic Force Microscopy

3.3K
Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
3.3K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Visualizing Superconducting Gap Modulation Induced by Pair-Breaking Scattering Interference in Bulk FeSe.

Nano letters·2026
Same author

Emergent Network of Josephson Junctions in a Kagome Superconductor.

Nano letters·2026
Same author

Infection following foot and ankle surgery : a subanalysis of data captured from the UK Foot and Ankle Thromboembolism (FATE) audit.

The bone & joint journal·2026
Same author

Anomalous Spin-Optical Helical Effect in Ti-Based Kagome Metal.

Advanced materials (Deerfield Beach, Fla.)·2026
Same author

Reply to: Limitations of probing field-induced response with STM.

Nature·2026
Same author

Common Sublattice-Pure Van Hove Singularities in the Kagome Superconductors AV_{3}Sb_{5} (A=K, Rb, Cs).

Physical review letters·2026

Related Experiment Video

Updated: May 28, 2025

Scanning-probe Single-electron Capacitance Spectroscopy
10:53

Scanning-probe Single-electron Capacitance Spectroscopy

Published on: July 30, 2013

13.0K

Deriving Material Properties from Feedback Error Signals in Scanning Tunneling Microscopy.

Nileema Sharma1,2, James McKenzie1,2, Matthew Toole1,2

  • 1Department of Physics and Astronomy, University of Notre Dame, Notre Dame, Indiana 46556, United States.

Nano Letters
|February 12, 2025
PubMed
Summary

Deviations in scanning tunneling microscopy (STM) current, typically ignored, reveal physical properties. This study shows these errors encode local barrier heights and differential conductance, enabling rapid measurements.

Keywords:
constant current modeerrorfeedback loopperturbationscanning tunneling microscopy

More Related Videos

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

9.5K
Probing the Structure and Dynamics of Interfacial Water with Scanning Tunneling Microscopy and Spectroscopy
10:28

Probing the Structure and Dynamics of Interfacial Water with Scanning Tunneling Microscopy and Spectroscopy

Published on: May 27, 2018

8.7K

Related Experiment Videos

Last Updated: May 28, 2025

Scanning-probe Single-electron Capacitance Spectroscopy
10:53

Scanning-probe Single-electron Capacitance Spectroscopy

Published on: July 30, 2013

13.0K
All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

9.5K
Probing the Structure and Dynamics of Interfacial Water with Scanning Tunneling Microscopy and Spectroscopy
10:28

Probing the Structure and Dynamics of Interfacial Water with Scanning Tunneling Microscopy and Spectroscopy

Published on: May 27, 2018

8.7K

Area of Science:

  • Surface science
  • Scanning probe microscopy
  • Physical measurement techniques

Background:

  • Scanning tunneling microscopy (STM) uses a negative feedback loop to maintain constant tunneling current.
  • Fluctuations around the set point current are usually disregarded as insignificant noise.
  • Understanding measurement imperfections can yield valuable physical insights.

Purpose of the Study:

  • To investigate the information contained within ignored current deviations in STM.
  • To explore the physical properties encoded by these deviations under periodic perturbation.
  • To assess the generalizability of this phenomenon to other feedback systems.

Main Methods:

  • Experimental observation of persistent DC current offsets in constant-current STM.
  • Theoretical modeling of the interplay between rectification and active feedback compensation.
  • Periodic perturbation of the tunneling junction.

Main Results:

  • An unexpected persistent DC current offset was observed when the tunneling junction was periodically perturbed.
  • These error signals were demonstrated to encode local tunneling barrier heights.
  • The square of local differential conductance was also found to be encoded in the error signals.

Conclusions:

  • Measurement deviations in STM, when analyzed, provide valuable physical property information.
  • This phenomenon arises from the interaction of rectification and active feedback.
  • The approach allows for rapid physical property measurements, potentially replacing lock-in amplifiers.