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Updated: Apr 13, 2026

In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
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Dielectric Permittivity in Copper Leaching: A Review

Marcos Andreu1, Robert Zwick2, Moe Momayez1

  • 1Department of Mining and Geological Engineering, The University of Arizona, Tucson, AZ 85719, USA.

Sensors (Basel, Switzerland)
|February 13, 2025
PubMed

Keywords:
copper leachingdielectric permittivityore permittivity

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