Electrodeposition
Metal-Semiconductor Junctions
Potential Due to a Polarized Object
Crystal Field Theory - Octahedral Complexes
Coulomb's Law
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Updated: May 27, 2025

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Zipei Tan1, Xuanyu Huang2,3, Jinbo Bian1
1Center for Nano and Micro Mechanics and Applied Mechanics Laboratory, Department of Engineering Mechanics, Tsinghua University, Beijing 100084, China.
Researchers discovered a new way to control electrical charge on 2D materials using a sliding interface. This method allows for reversible charge deposition, crucial for advanced electronic devices and energy applications.
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