Molecular dynamics study on the mitigation of radiation damage caused by electron pulses

The reduction of radiation damage represents a long-term objective for electron microscopists, particularly those engaged in the study of biological and organic matter. Recently, electron pulses in ultrafast transmission electron microscopy have been demonstrated to serve as a damage mitigation technique for radiation-sensitive materials. Nevertheless, the underlying mechanism of the mitigation effects remains unclear. In this study, we investigate the radiation damage of graphene induced by pulsed electrons using molecular dynamics simulations within the framework of binary elastic collisions. For electron irradiation at 200 keV, it was found that the pulsed electron beam corresponds to a larger threshold angle (1.4 rad) than that for a random beam (1.0 rad). This is because two electrons can be prevented from briefly interacting with the same or a neighboring atom by the use of well-controlled electron pulses. While such a mitigation of radiation damage is only apparent near the threshold angle, and there are likely other reduction mechanisms, our results provide insight into the mitigated radiation damage of electron pulses.