Related Experiment Video
Updated: May 27, 2025

08:35
Achieving Efficient Fragment Screening at XChem Facility at Diamond Light Source
Published on: May 29, 2021
5.0K
Design of a robot-automated flat plate/reflection geometry x-ray diffraction setup for accelerated materials
Christopher A Crain1, Kevin H Stone1, Charles Troxel1
1Stanford Synchrotron Radiation Lightsource, SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA.
The Review of Scientific Instruments
|February 19, 2025
Summary
A new automated system for X-ray diffraction (XRD) measurements was developed for high-throughput analysis of solid oxide electrolysis button cells (SOECs). This system enhances sample loading, alignment, and data acquisition, enabling rapid analysis of up to 84 samples.
Area of Science:
- Materials Science
- Analytical Chemistry
- Synchrotron Radiation
Background:
- Automated sample handling is crucial for high-throughput analysis in materials science.
- X-ray diffraction (XRD) is a powerful technique for material characterization.
- Current methods for XRD sample preparation and analysis can be time-consuming.
Purpose of the Study:
- To design, construct, and automate a novel system for XRD measurements in reflection geometry.
- To improve the efficiency and reproducibility of sample loading, alignment, and data acquisition.
- To enable high-throughput analysis of solid oxide electrolysis button cells (SOECs) and other sample types.
Main Methods:
- Development of a single-platform system with compartmentalized sample storage, transfer, and positioning.
- Integration of a six-axis robotic arm for precise and programmable sample manipulation.
- Utilization of 3D printed sample mounts and cassettes for flexible sample accommodation (up to 84 samples).
Main Results:
- The automated system demonstrated facile transferability and adaptability to various beamline environments.
- The robotic arm enabled highly reproducible movements for precise sample alignment.
- The system processed up to 84 SOEC samples in approximately 24 hours, including long exposure scans.
Conclusions:
- The developed automated system significantly enhances the efficiency of XRD measurements.
- The modular and adaptable design allows for broad applicability across different sample types and beamline configurations.
- This automation facilitates high-throughput characterization, accelerating materials research and development.
Related Concept Videos
X-ray Diffraction of Biological Samples
3.8K
X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are scattered by the electron clouds around the sample atoms. The X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal...
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are scattered by the electron clouds around the sample atoms. The X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal...
3.8K
X-ray Crystallography
23.7K
The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
23.7K

