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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

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Progress in element analysis on a high-voltage electron microscope

W F Tivol, D Barnard, T Guha

    Scanning Electron Microscopy
    |January 1, 1985
    PubMed

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