Molecular and Ionic Solids
Metallic Solids
Ionic Bonding and Electron Transfer
Formal Charges
Ionic Crystal Structures
Bonding in Metals
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Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Hanzhi Shang1, Zeyu Jiang1, Yiyang Sun1
1Rensselaer Polytechnic Institute, Department of Physics, Applied Physics and Astronomy, Troy, New York 12180, USA.
Accurate defect formation energies in microelectronics are achieved by refining total energy calculations. This study demonstrates that potential alignment corrections are unnecessary, and Makov-Payne corrections provide precise results for defect physics.
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