Quantitatively Profiling the Evolution of Hydrogen Storage and Defect Healing Processes in Palladium at the Nanoscale
Yu-Cheng Chiu1,2, Bo-Yi Chen1, Chin-Chia Hsu1,2
1Center for Condensed Matter Sciences, National Taiwan University, Taipei 10617, Taiwan.
ACS Nano
|March 4, 2025
Summary
A new scanning electron microscopy technique, ZEM, directly measures thermal absorbance, enabling sensitive detection of light elements like hydrogen. This method reveals detailed insights into hydrogen storage in materials, including defect formation and healing.
Area of Science:
- Materials Science
- Nanotechnology
- Analytical Chemistry
Background:
- Detecting light elements (atomic number Z < 10) is challenging due to weak electron and photon interactions.
- Characterizing hydrogen storage materials requires sensitive methods for low Z elements.
Purpose of the Study:
- Introduce a direct thermal absorbance measurement platform for scanning electron microscopy (ZEM).
- Demonstrate ZEM's sensitivity to low Z materials, including hydrogen (Z=1) and vacancies (Z=0).
- Explore ZEM's potential in characterizing hydrogen storage in Palladium (Pd).
Main Methods:
- Developed a direct thermal absorbance measurement platform integrated with scanning electron microscopy (ZEM).
- Applied ZEM to characterize hydrogen storage in Pd, analyzing hydrogen distribution and defects.
- Investigated multiple hydrogen charging-discharging cycles using ZEM's nondestructive detection.
Main Results:
- ZEM revealed inhomogeneous hydrogen storage in Pd, concentrating on grain boundaries and defects.
- Hydrogenation created significant defect density and subsurface voids.
- Observed two distinct hydrogen uptake phenomena and defect healing processes during cycling.
- Established causality between hydrogenation and defect formation, quantifying hydrogen-defect correlations.
Conclusions:
- ZEM is a powerful, nondestructive technique for characterizing light elements and compounds.
- The study uncovered rich phenomena in hydrogen storage materials, highlighting ZEM's potential for advanced material characterization.


