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Updated: May 24, 2025

Rejection of Fluorescence Background in Resonance and Spontaneous Raman Microspectroscopy
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Resolution enhancement of total internal reflection microscopy via polarised scattering

Chenguang Liu1,2, Zhao Chen1, Zhenlong Xu1

  • 1Advanced Microscopy and Instrumentation Research Center, School of Instrumentation Science and Engineering, Harbin Institute of Technology, Harbin, China.

Journal of Microscopy
|March 5, 2025
PubMed

Keywords:
microscopypolarised scatteringresolution enhancementself‐correlation cumulant

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