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Piezoelectricity in half-Heusler narrow-bandgap semiconductors
1State Key Laboratory of Silicon and Advanced Semiconductor Materials, School of Materials Science and Engineering, Zhejiang University, Hangzhou, P. R. China.
Abstract:
Piezoelectricity is primarily observed in noncentrosymmetric insulators or wide bandgap semiconductors. We report the observation of the piezoelectric (PE) effect in half-Heusler (HH) narrow-bandgap semiconductors TiNiSn, ZrNiSn, and TiCoSb. These materials exhibit shear PE strain coefficients that reach ~38 and 33 picocoulombs per newton in ZrNiSn and TiCoSb, respectively, which are high values for noncentrosymmetric nonpolar materials. We demonstrated a TiCoSb-based PE sensor with a large voltage response and capable of charging a capacitor. The PE effect in HHs remains thermally stable up to 1173 kelvin, underscoring their potential for high-temperature applications. Our observations suggest that these HH narrow-bandgap semiconductors may find promising applications for advanced multifunctional technologies.
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