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Self-focusing high-frequency ultrasonic transducers for non-destructive testing applications
Jianxin Zhao1, Jialin Hao1, Dongdong Chen2
1Northwest Institute of Mechanical and Electrical Engineering, Xianyang, 712099, Shaanxi, China.
A novel self-focusing ultrasonic transducer uses half-concave piezoelectric elements for high-frequency non-destructive testing (NDT). This innovative design improves resolution and efficiency for industrial defect detection, particularly in chip packaging.
Area of Science:
- Materials Science
- Acoustics
- Non-Destructive Testing
Background:
- High-frequency acoustic waves are crucial for industrial non-destructive testing (NDT) due to their high resolution and sensitivity.
- Current focusing methods for high-frequency transducers, such as mechanical pressure and lens focusing, can cause damage and reduce transmission efficiency.
Purpose of the Study:
- To propose and demonstrate an efficient self-focusing approach for high-frequency ultrasonic transducers.
- To overcome the limitations of traditional focusing methods in NDT applications.
Main Methods:
- Utilized half-concave piezoelectric elements to achieve self-focusing at high frequencies.
- Employed precise micro-nano processing technology for transducer design and fabrication.
- Characterized the transducer's performance at a high frequency of 62.7 MHz.
Main Results:
- Successfully designed and fabricated a self-focusing half-concave ultrasonic transducer.
- Achieved excellent lateral resolution of 39 μm and a -6 dB bandwidth of 76.6%.
- Demonstrated outstanding imaging performance on a multilayer circuit board and a chip.
Conclusions:
- The self-focusing half-concave high-frequency ultrasonic transducer shows significant potential for industrial NDT.
- This technology is particularly promising for high-resolution defect detection in chip packaging.
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