A model-free framework for evaluating the reliability of a new device with multiple imperfect reference standards

Ying Cui1, Qi Yu1, Amita Manatunga1

  • 1Department of Biostatistics and Bioinformatics, Emory University, Atlanta, GA 30329, United States.

Biometrics
|March 17, 2025
PubMed
Summary

Evaluating new computer-aided diagnostic (CAD) devices is challenging without a gold standard. This study introduces a statistical framework to assess CAD device reliability using multiple imperfect reference standards, accounting for accuracy variations.

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