Emerging Thermal Detectors Based on Low-Dimensional Materials: Strategies and Progress

Thermal detectors, owing to their broadband spectral response and ambient operating temperature capabilities, represent a key technological avenue for surpassing the inherent limitations of traditional photon detectors. A fundamental trade-off exists between the thermal properties and the response performance of conventional thermosensitive materials (e.g., vanadium oxide and amorphous silicon), significantly hindering the simultaneous enhancement of device sensitivity and response speed. Recently, low-dimensional materials, with their atomically thin thickness leading to ultralow thermal capacitance and tunable thermoelectric properties, have emerged as a promising perspective for addressing these bottlenecks. Integrating low-dimensional materials with metasurfaces enables the utilization of subwavelength periodic configurations and localized electromagnetic field enhancements. This not only overcomes the limitation of low light absorption efficiency in thermal detectors based on low-dimensional materials (TDLMs) but also imparts full Stokes polarization detection capability, thus offering a paradigm shift towards multidimensional light field sensing. This review systematically elucidates the working principle and device architecture of TDLMs. Subsequently, it reviews recent research advancements in this field, delving into the unique advantages of metasurface design in terms of light localization and interfacial heat transfer optimization. Furthermore, it summarizes the cutting-edge applications of TDLMs in wideband communication, flexible sensing, and multidimensional photodetection. Finally, it analyzes the major challenges confronting TDLMs and provides an outlook on their future development prospects.