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Quantifying phase magnitudes of open-source focused-probe 4D-STEM ptychography reconstructions.

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  • 1Faculty of Physics, University of Vienna, Vienna, Austria.

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Summary

This study compares open-source algorithms for electron ptychography phase reconstruction in 4D-STEM imaging of graphene. Results guide data sampling for precise atomic phase shift analysis, especially for defects.

Keywords:
4D‐STEMelectron ptychographyfocused‐probegrapheneopen‐sourcephase quantification

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Area of Science:

  • Materials Science
  • Electron Microscopy
  • Computational Imaging

Background:

  • Four-dimensional scanning transmission electron microscopy (4D-STEM) relies on accurate phase reconstructions.
  • Advancements in direct-electron cameras and open-source software enhance accessibility and comparability of 4D-STEM analyses.
  • Monolayer graphene serves as an ideal sample for dose-robust phase object studies.

Purpose of the Study:

  • To reconstruct atomic phase shifts from 4D-STEM data of pristine monolayer graphene.
  • To compare the computational efficiency and reconstruction quality of various open-source phase reconstruction algorithms.
  • To evaluate the tolerance of these algorithms to data downsampling techniques.

Main Methods:

  • Utilized a Dectris ARINA detector on a Nion UltraSTEM 100 at 60 keV.
  • Acquired convergent-beam electron diffraction (CBED) patterns from monolayer graphene.
  • Applied and compared direct and iterative open-source phase reconstruction algorithms.
  • Assessed phase image quality by quantifying atomic phase shift variations.

Main Results:

  • Reconstructed atomic phase shifts from graphene using multiple algorithms.
  • Observed overall agreement in phase shifts but noted differences in absolute magnitudes and variations.
  • Found that data downsampling (reciprocal-space binning, real-space thinning) impacts reconstruction quality.
  • Identified limitations in precision for unique sites like defects or dopants.

Conclusions:

  • Open-source algorithms provide valuable tools for electron ptychography phase reconstruction.
  • Findings offer guidance on data sampling strategies for achieving desired phase precision.
  • Quantitative analysis of atomic-scale electromagnetic properties using electron ptychography requires careful consideration of precision limits, especially for defect sites.