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Total internal reflection fluorescence microscopy or TIRF is an advanced microscopic technique used to visualize fluorophores in samples close to a solid surface with a higher refractive index, such as a glass coverslip. TIRF only allows fluorophores in proximity to the solid surface to be excited. When light from a medium with a lower refractive index (such as air) hits the glass coverslip at a critical angle, the light undergoes total internal reflection stead of passing through the glass.
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    Area of Science:

    • Optical Imaging
    • Spectroscopy
    • Materials Science

    Background:

    • Spectroscopic microtomography enables non-destructive measurement of material properties.
    • Current methods suffer from low throughput due to extensive scanning requirements.

    Purpose of the Study:

    • To develop a high-throughput spectroscopic microtomography system.
    • To enable rapid analysis of complex microspecimens in the short-wave infrared (SWIR) range.

    Main Methods:

    • Utilized snapshot optical tomography combined with Fourier transform spectroscopy.
    • Implemented a novel system for high-throughput data acquisition.

    Main Results:

    • Achieved high-throughput spectroscopic microtomography in the SWIR (1100-1600 nm).
    • Successfully measured attenuation coefficient spectra of hair medulla and cortex.

    Conclusions:

    • The developed system offers a significant advancement in imaging speed for spectroscopic microtomography.
    • Enables detailed spectral analysis of biological and material structures.