Related Experiment Video
Updated: May 16, 2025

15:04
Picometer-Precision Atomic Position Tracking through Electron Microscopy
Published on: July 3, 2021
6.3K
Real-time antiproton annihilation vertexing with submicrometer resolution.
Michael Berghold1, Davide Orsucci2, Francesco Guatieri1,3,4
1Research Neutron Source Heinz Maier-Leibnitz (FRM II), Technical University of Munich, Lichtenbergstr. 1 Garching bei München, 85748 Bayern Germany.
Science Advances
|April 2, 2025
Summary
The AEḡIS experiment aims to measure antihydrogen free fall using a novel vertexing detector. This new technology achieves unprecedented accuracy in pinpointing annihilation events, advancing antihydrogen gravity research.
Area of Science:
- Antimatter physics
- Gravitational measurements
- Particle detection
Background:
- The AEḡIS experiment seeks to precisely measure the free fall of antihydrogen in Earth's gravitational field.
- Accurate vertexing of antiproton annihilations is crucial for determining antihydrogen's trajectory.
Purpose of the Study:
- Introduce and validate a novel vertexing detector for antiproton annihilations.
- Demonstrate the detector's capability for high-precision position measurement.
- Assess the sensor's suitability for antihydrogen gravity measurements.
Main Methods:
- Utilized a modified mobile camera sensor as a vertexing detector.
- Experimentally measured the position of antiproton annihilation events.
- Evaluated the sensor's sensitivity to light for in situ calibration.
Main Results:
- Achieved position measurement accuracy of [Formula: see text] μm for antiproton annihilations.
- Demonstrated a 35-fold improvement in real-time antiproton vertexing accuracy.
- Confirmed the sensor's light sensitivity enables in situ moiré deflectometer calibration.
Conclusions:
- The developed vertexing detector is a breakthrough technology for the AEḡIS experiment.
- The sensor significantly reduces systematic errors in antihydrogen gravity measurements.
- This technology will form the basis for large-area detectors for future antihydrogen studies.
Related Concept Videos
Atomic Force Microscopy
3.3K
Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
3.3K
Mass Analyzers: Overview
540
The mass analyzer is a crucial component of the mass spectrometer. In the ionization chamber, the vaporized sample is bombarded with a high-energy electron beam to generate a radical cation and further fragment into neutral molecules, radicals, and cations. A series of negatively charged accelerator plates accelerate the cations into the mass analyzer. The mass analyzer separates ions according to their mass-to-charge (m/z) ratios and then directs them to the detector. The common types of mass...
540

