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Updated: May 15, 2025

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
08:12

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on: December 5, 2015

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Electric field-driven the electronic properties and contact behavior of the metal/semiconductor NbS2/Sc2CF2

Thi Nhan Tran1, Pham T Truong2,3, Huynh V Phuc2

  • 1Faculty of Fundamental Sciences, Hanoi University of Industry, 298 Cau Dien, Bac Tu Liem, Hanoi 100000, Vietnam. tran.nhan@haui.edu.vn.

Dalton Transactions (Cambridge, England : 2003)
|April 7, 2025
PubMed

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