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Updated: May 15, 2025

From Voxels to Knowledge: A Practical Guide to the Segmentation of Complex Electron Microscopy 3D-Data
Published on: August 13, 2014
Deep learning assisted high-resolution microscopy image processing for phase segmentation in functional composite
Ganesh Raghavendran1, Bing Han1,2, Fortune Adekogbe3
1Aiiso Yufeng Li Family Department of Chemical and Nano Engineering, University of California San Diego, La Jolla, California, USA.
Abstract:
In the domain of battery research, the processing of high-resolution microscopy images is a challenging task, as it involves dealing with complex images and requires a prior understanding of the components involved. The utilisation of deep learning methodologies for image analysis has attracted considerable interest in recent years, with multiple investigations employing such techniques for image segmentation and analysis within the realm of battery research. However, the automated analysis of high-resolution microscopy images for detecting phases and components in composite materials is still an underexplored area. This work proposes a novel workflow for FFT-based segmentation, periodic component detection and phase segmentation from raw high-resolution Transmission Electron Microscopy (TEM) images using a trained U-Net segmentation model. The developed model can expedite the detection of components and their phase segmentation, diminishing the temporal and cognitive demands associated with scrutinising an extensive array of TEM images, thereby mitigating the potential for human errors. This approach presents a novel and efficient image analysis approach with broad applicability beyond the battery field and holds potential for application in other related domains characterised by phase and composition distribution, such as alloy production.
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